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It is well known that metrology is as important as polishing for precision optics manufacturing. Safran Reosc has naturally built up through the years a unique skill in designing and developing precision optical metrology set-up for all size and shape of optics.
The control of the residual defect along all the spatial frequencies is mandatory in order to ensure high imaging resolution, low flare and low losses by diffusion from the various components of the optical system.
Atomic force microscope
A small portable Atomic Force Microscope allows us to conduct measurement down to sub-Angströem. The device is installed within and acoustic protection chamber and can also be directly installed on the optical surface of large optics to assess their micro-roughness quality.
The spatial frequency domain is 1 µm to 100 µm.